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Journal of Electron Microscopy, Vol. 54, Iss. 5, 2005-10 ,pp. : 455-460

Oxford University Press

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Computer-assisted simulation of high-voltage electron microscopy using serial images recorded by conventional transmission electron microscopy

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Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images

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From the physics of secondary electron emission to image contrasts in scanning electron microscopy

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A method for efficient observation of intracellular membranes of monolayer culture cells by quick-freeze and freeze-fracture electron microscopy

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