Attainable Resolution of Energy-Selecting Image Using High-Voltage Electron Microscope

By Kurata Hiroki   Moriguchi Sakumi   Isoda Seiji   Kobayashi Takashi  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 79-84

Oxford University Press

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Nanomanipulation of biological samples using a compact atomic force microscope under scanning electron microscope observation

By Iwata Futoshi   Mizuguchi Yuya   Ko Hideyuki   Ushiki Tatsuo  

Journal of Electron Microscopy, Vol. 60, Iss. 6, 2011-12 ,pp. : 359-366

Oxford University Press

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A practical method for the remote control of the scanning electron microscope

By Yamada1 *- Atsushi   Hirahara1 Osamu   Tsuchida2 Takayoshi   Sugano2 Naoki   Date1 Masaru  

Journal of Electron Microscopy, Vol. 52, Iss. 2, 2003-05 ,pp. : 101-109

Oxford University Press

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Development of a Nanoprobe Cathodoluminescence Scanning Electron Microscope

By Matsuo Hiroshi   Kobayashi Nobutaka   Kimura Yoshihide   Shimizu Ryuichi  

Journal of Electron Microscopy, Vol. 45, Iss. 5, 1996-10 ,pp. : 453-457

Oxford University Press

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Depth sectioning of aligned crystals with the aberration-corrected scanning transmission electron microscope

By Borisevich Albina Y.   Lupini Andrew R.   Travaglini Samuel   Pennycook Stephen J.  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 7-12

Oxford University Press

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