A Linear Charge-Coupled Device Detector System for Spectroscopy

By Sweedler Jonathan V.   Jalkian Rafi D.   Denton M. Bonner  

Applied Spectroscopy, Vol. 43, Iss. 6, 1989-08 ,pp. : 953-962

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Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

By Soudier Luc   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 49, Iss. 10, 1995-10 ,pp. : 1478-1484

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Use of Normalized Relative Line Intensities for Qualitative and Semiquantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part III: Application to Laser Ablation

By Cabalin Luisa Maria   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 51, Iss. 6, 1997-06 ,pp. : 898-901

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Integration of an Intensified Charge-Coupled Device (ICCD) Camera for Accurate Spectroscopic Measurements

By Peláez Ramón Javier   Mar Santiago   Aparicio Juan Antonio   Belmonte María Teresa  

Applied Spectroscopy, Vol. 66, Iss. 8, 2012-08 ,pp. : 970-978

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Determining the Spectral Resolution of a Charge-Coupled Device (CCD) Raman Instrument

By Liu Chuan   Berg Rolf W.  

Applied Spectroscopy, Vol. 66, Iss. 9, 2012-09 ,pp. : 1034-1043

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