Use of Normalized Relative Line Intensities for Qualitative and Semi-quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part II: Applications to Qualitative Analysis with Line-Rich Matrices

Author： Rivier Cedric   Mermet Jean-Michel  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.50, Iss.8, 1996-08, pp. : 959-964

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