Applications of Microstructured Silicon Wafers as Internal Reflection Elements in Attenuated Total Reflection Fourier Transform Infrared Spectroscopy

Author: Schumacher Henrik   Künzelmann Ulrich   Vasilev Boris   Eichhorn Klaus-Jochen   Bartha Johann W.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.64, Iss.9, 2010-09, pp. : 1022-1027

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