Technological Methods for Improving IC Reliability in Mass Production

Author： Gorlov M. I.   Andreev A. V.   Anufriev L. P.   Emel'yanov V. A.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7397

Source： Russian Microelectronics, Vol.33, Iss.1, 2004-01, pp. : 18-26

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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