Defect formation in epitaxial GaP junctions under heat treatment

Author: Boulyrskii S.   Groushko N.   Kazakov D.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7397

Source: Russian Microelectronics, Vol.34, Iss.1, 2005-01, pp. : 36-42

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Abstract