Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging

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Materials Science and Technology, Vol. 11, Iss. 1, 1995-01 ,pp. : 66-71

Maney Publishing

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A digital system for producing X-ray images with a high spatial resolution

By Kononov N.   Ignatov S.   Potapov V.   Negorezov V.  

Instruments and Experimental Techniques, Vol. 49, Iss. 5, 2006-10 ,pp. : 739-741

MAIK Nauka/Interperiodica

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X-ray diffraction characterisation of expanded austenite and ferrite in plasma nitrided stainless steels

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Surface Engineering, Vol. 26, Iss. 4, 2010-05 ,pp. : 265-270

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Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs

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X-ray characterisation of InGaAs/AlAs multiple quantum well p–i–n structures

By Hart L.   Ghisoni M.   Stavrinou P.   Roberts C.   Parry G.  

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