Nanomodification of silicon (100) surface with scanning tunnelling microscopy using polysilicon on silicon structure

Author： Pérez-Murano F.   Barniol N.   Abadal G.   Ye J. H.   Aymerich X.   Cané C.  

Publisher： Maney Publishing

ISSN： 1743-2847

Source： Materials Science and Technology, Vol.11, Iss.1, 1995-01, pp. : 85-89

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Quantitative sub-surface and non-contact imaging using scanning microwave microscopy

By  

Nanotechnology, Vol. 26, Iss. 13, 2015-03 ,pp. : 135701-135709

IOP Publishing

Access to resources Recommend Favorite

Characterisation of semi-insulating polysilicon oxygen doped silicon thin films

By Lynch S.   Greef R.   Stoemenos J.   Dartnell N. J.   Lloyd N. S.   Kern P.   Stuck R.   Crean G. M.  

Materials Science and Technology, Vol. 11, Iss. 1, 1995-01 ,pp. : 80-84

Maney Publishing

Access to resources Recommend Favorite

Potential barrier height at the grain boundaries of a poly-silicon nanowire

By EnglanderDanny   HorvitzDror   ShamirAssaf   AmitIddo   RosenwaksYossi  

Nanotechnology, Vol. 26, Iss. 35, 2015-09 ,pp. : 355201-355206

IOP Publishing

Access to resources Recommend Favorite

Surface tension of liquid silicon

By Shishkin A.   Basin A.  

Theoretical Foundations of Chemical Engineering, Vol. 38, Iss. 6, 2004-11 ,pp. : 660-668

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Supramolecular chemistry at the liquid/solid interface probed by scanning tunnelling microscopy

By Feyter S. De   Uji-i H.   Mamdouh W.   Miura A.   Zhang J.   Jonkheijm P.   Schenning A.P.H.J.   Meijer E.W.   Chen Z.   Wurthner F.   Schuurmans N.   Esch J. Van   Feringa B.L.   Dulcey A.E.   Percec V.   Schryver F.C. De  

International Journal of Nanotechnology, Vol. 3, Iss. 4, 2006-10 ,pp. : 462-479

Inderscience Publishers

Access to resources Recommend Favorite