Minority and majority carrier traps associated with oxidation induced stacking faults in silicon

Author： Evans J. H.   Davidson J. A.   Saritas M.   Vandini M.   Qian Y.   Peaker A. R.  

Publisher： Maney Publishing

ISSN： 1743-2847

Source： Materials Science and Technology, Vol.11, Iss.7, 1995-07, pp. : 696-701

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