Electrical characterisation of epitaxial 6H-SiC by admittance spectroscopy

Author: Raynaud C.   Ducroquet F.   Brounkov P. N.   Guillot G.   Porter L. M.   Davis R. F.   Jaussaud C.   Billon T.  

Publisher: Maney Publishing

ISSN: 1743-2847

Source: Materials Science and Technology, Vol.12, Iss.1, 1996-01, pp. : 94-97

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Abstract