Improving Breakdown Behavior by Substrate Bias in a Novel Double Epi-layer Lateral Double Diffused MOS Transistor

Author: Qi Li   Wei-Dong Wang   Yun Liu   Xue-Ming Wei  

Publisher: IOP Publishing

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.29, Iss.2, 2012-02, pp. : 27303-27305

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