Evolution of Residual Stress and Structure in YSZ/SiO2 Multilayers with Different Modulation Ratios

Author: Qi-Ling Xiao   Guo-Hang Hu   Hong-Bo He   Jian-Da Shao  

Publisher: IOP Publishing

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.30, Iss.2, 2013-02, pp. : 24206-24208

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Abstract