Reduction of defect density by rapid thermal annealing in GaAsBi studied by time-resolved photoluminescence

Author: Mazzucato S   Boonpeng P   Carrère H   Lagarde D   Arnoult A   Lacoste G   Zhang T   Balocchi A   Amand T   Marie X   Fontaine C  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.28, Iss.2, 2013-02, pp. : 22001-22005

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