A new bottom-up methodology to produce silicon layers with a closed porosity nanostructure and reduced refractive index

Author: Godinho V   Caballero-Hernández J   Jamon D   Rojas T C   Schierholz R   García-López J   Ferrer F J   Fernández A  

Publisher: IOP Publishing

ISSN: 0957-4484

Source: Nanotechnology, Vol.24, Iss.27, 2013-07, pp. : 275604-275613

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