Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry

Author： Avilov A.   Baturin A.   Volkov V.   D’yakova Yu.   Ermakova M.   Kuzin A.   Marchenkova M.   Mityukhlyaev V.   Seregin A.   Sul’yanov S.   Tereshchenko E.   Todua P.  

Publisher： Springer Publishing Company

ISSN： 0543-1972

Source： Measurement Techniques, Vol.56, Iss.9, 2013-12, pp. : 992-998

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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