

Author: Xian A-P.
Publisher: Springer Publishing Company
ISSN: 0022-2461
Source: Journal of Materials Science, Vol.32, Iss.23, 1997-12, pp. : 6387-6393
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


By Wang Shuang Su Hao Chen Liying Yuan Haiyi
Journal of Materials Science: Materials in Electronics, Vol. 21, Iss. 11, 2010-11 ,pp. :




Fatigue crack growth behavior of Sn-Pb and Sn-based lead-free solders
By Zhao J. Mutoh Y. Miyashita Y. Wang L.
Engineering Fracture Mechanics, Vol. 70, Iss. 15, 2003-10 ,pp. :




By Zheng X. H. Chen X. M. Zeng Y. W.
Journal of Materials Science: Materials in Electronics, Vol. 15, Iss. 11, 2004-11 ,pp. :