Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

By Müller F.   Müller A.-D.   Schulze S.   Hietschold M.  

Journal of Materials Science, Vol. 39, Iss. 9, 2004-05 ,pp. : 3199-3200

Springer Publishing Company

Access to resources Recommend Favorite

Effect of fluorine impurity on the oxidation of silicon oxynitride ceramics doped with gadolinium oxide

By Ohashi M.   Nakamura K.   Iida Y.  

Journal of Materials Science, Vol. 35, Iss. 22, 2000-11 ,pp. : 5725-5729

Springer Publishing Company

Access to resources Recommend Favorite

Analysis of Magnetron-Deposited Titanium Oxynitride Coatings by Scanning Electron Microscopy and Raman Scattering

By  

Advanced Materials Research, Vol. 2015, Iss. 1084, 2015-02 ,pp. : 3-6

Trans Tech Publications

Access to resources Recommend Favorite

Characterization of silicon oxynitride thin films deposited by electron beam physical vapor deposition technique

By Mohite K.C.   Khollam Y.B.   Mandale A.B.   Patil K.R.   Takwale M.G.  

Materials Letters, Vol. 57, Iss. 26, 2003-09 ,pp. : 4170-4175

Elsevier

Access to resources Recommend Favorite

Transmission electron microscopy studies of the bonded SiC-SiC interface

By Yushin G.   Kvit A.   Sitar Z.  

Journal of Materials Science, Vol. 40, Iss. 16, 2005-08 ,pp. : 4369-4371

Springer Publishing Company

Access to resources Recommend Favorite