Author: Balikci Ercan Abbaschian Reza
Publisher: Springer Publishing Company
ISSN: 0022-2461
Source: Journal of Materials Science, Vol.40, Iss.6, 2005-03, pp. : 1475-1479
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Seebeck Coefficient of Ge-on-Insulator Layers Fabricated by Direct Wafer Bonding Process
Advanced Materials Research, Vol. 2015, Iss. 1117, 2015-08 ,pp. :