Dual-environment effects on the oxidation of metallic interconnects

Author: Holcomb Gordon   Ziomek-Moroz Malgorzata   Cramer Stephen   Covino Bernard   Bullard Sophie  

Publisher: Springer Publishing Company

ISSN: 1059-9495

Source: Journal of Materials Engineering and Performance, Vol.15, Iss.4, 2006-08, pp. : 404-409

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