Scattering from Body Thickness Fluctuations in Double Gate MOSFETs: An ab initio Monte Carlo Simulation Study

Author: Riddet C.   Brown A.   Alexander C.   Watling J.   Roy S.   Asenov A.  

Publisher: Springer Publishing Company

ISSN: 1569-8025

Source: Journal of Computational Electronics, Vol.3, Iss.3-4, 2004-10, pp. : 341-345

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