High Frequency LIMM - A Powerful Tool for Ferroelectric Thin Film Characterization

Author： Sandner T. Suchaneck G. Koehler R. Suchaneck A. Gerlach G.

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.46, Iss.1, 2002-01, pp. : 243-257

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