INTEGRATION PROCESSES AND PROPERTIES OF SEMICONDUCTIVE OXIDE MEMORY TRANSISTOR

Author: LI TINGKAI   HSU SHENG   ULRICH BRUCE   EVANS DAVE  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.81, Iss.1, 2006-11, pp. : 27-36

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Abstract