Publisher: Taylor & Francis Ltd
ISSN: 1362-3060
Source: International Journal of Electronics, Vol.94, Iss.5, 2007-05, pp. : 481-500
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Instruction-Based Self-Testing of Processor Cores
By Kranitis N.
Journal of Electronic Testing, Vol. 19, Iss. 2, 2003-04 ,pp. :
By Fu Wen-Hui Jiang Jun Qin Xi Yi Ting Hong Zhi-Liang
Analog Integrated Circuits and Signal Processing, Vol. 68, Iss. 1, 2011-07 ,pp. :