Impact of device geometry at different ambient temperatures on the self-heating of GaN-based HEMTs

Author: Martin-Horcajo S   Wang A   Romero M F   Tadjer M J   Koehler A D   Anderson T J   Calle F  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.29, Iss.11, 2014-11, pp. : 115013-115021

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next