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Effects of model polymer chain architectures of photo-resists on line-edge-roughness: Monte Carlo simulations
Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.10, Iss.1, 2005-01, pp. : 389-392
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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