Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.10, Iss.1, 2005-01, pp. : 23-26
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The base line problem in DLTS technique
Revue de Physique Appliquée (Paris), Vol. 24, Iss. 2, 1989-02 ,pp. :
Access to resources
Recommend
CAPACITANCE TRANSIENT SPECTROSCOPY (DLTS) OF EXTENDED DEFECTS IN SEMICONDUCTORS
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :
Investigation of the Transient Behavior of a Cantilever Beam Using PVDF Sensors
By Ma Chien-Ching Huang Yu-Hsi Pan Shan-Ying
Sensors, Vol. 12, Iss. 2, 2012-02 ,pp. :
Access to resources
A study of different types of current mirrors using polysilicon TFTs
Journal of Physics: Conference Series , Vol. 10, Iss. 1, 2005-01 ,pp. :