Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.163, Iss.1, 2009-04, pp. : 461-464
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Re-trapping and cooling of highly-charged ions
Journal of Physics: Conference Series , Vol. 163, Iss. 1, 2009-04 ,pp. :
EUV spectral lines of highly-charged Hf, Ta and Au ions observed with an electron beam ion trap
By Draganić Ilija N Ralchenko Yuri Reader Joseph Gillaspy J D Tan Joseph N Pomeroy Joshua M Brewer Samuel M Osin Dmitry
Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 44, Iss. 2, 2011-01 ,pp. :
By López-Urrutia JR C. Braun J Brenner G Bruhns H Draganič I N Martínez AJ González Lapierre A Mironov V Osborne C Sikler G Orts R Soria Tawara H Ullrich J Tupitsyn I I Shabaev V M
Canadian Journal of Physics, Vol. 83, Iss. 4, 2005-04 ,pp. :