A Back-Gated Ferroelectric Field-Effect Transistor with an Al-Doped Zinc Oxide Channel

Publisher: IOP Publishing

E-ISSN: 1741-3540|32|2|28501-28505

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.32, Iss.2, 2015-02, pp. : 28501-28505

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Abstract