

Publisher: IOP Publishing
E-ISSN: 1361-6641|30|3|35018-35022
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.30, Iss.3, 2015-03, pp. : 35018-35022
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content






By Takagaki Y Jenichen B Jahn U Manzke Y Ramsteiner M Friedland K-J
Semiconductor Science and Technology, Vol. 28, Iss. 2, 2013-02 ,pp. :




Compact analytical model for single gate AlInSb/InSb high electron mobility transistors
Journal of Semiconductors, Vol. 35, Iss. 11, 2014-11 ,pp. :