Plasma diagnostic approach for high rate nanocrystalline Si synthesis in RF/UHF hybrid plasmas using a PECVD process

Author: Sahu B B   Han Jeon G   Shin Kyung S   Ishikawa K   Hori M   Miyawaki Yudai  

Publisher: IOP Publishing

E-ISSN: 1361-6595|24|2|25019-25031

ISSN: 0963-0252

Source: Plasma Sources Science and Technology, Vol.24, Iss.2, 2015-04, pp. : 25019-25031

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Abstract