Nanoprobe mechanical and piezoelectric characterization of ScxAl1−xN(0001) thin films

E-ISSN： 1862-6319|212|3|666-673

ISSN： 1862-6300

Source： PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Vol.212, Iss.3, 2015-03, pp. : 666-673

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

The effect of metal‐rich growth conditions on the microstructure of ScxGa1−xN films grown using molecular beam epitaxy

PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Vol. 212, Iss. 12, 2015-12 ,pp. : 2837-2842

John Wiley & Sons Inc

Access to resources Recommend Favorite

Ultrasensitive Thin‐Film‐Based AlxGa1−xN Piezotronic Strain Sensors via Alloying‐Enhanced Piezoelectric Potential

ADVANCED MATERIALS, Vol. 27, Iss. 40, 2015-10 ,pp. : 6289-6295

John Wiley & Sons Inc

Access to resources Recommend Favorite

TiO thin films on GaN(0001)

PHYSICA STATUS SOLIDI (B) BASIC SOLID STATE PHYSICS, Vol. 252, Iss. 5, 2015-05 ,pp. : 1001-1005

John Wiley & Sons Inc

Access to resources Recommend Favorite

Influence of residual stresses on the mechanical properties of TiC x N 1-x (x=0, 0.15, 0.45) thin films deposited by arc evaporation

By Karlsson L. Hultman L. Sundgren J.-E.

Thin Solid Films, Vol. 371, Iss. 1, 2000-08 ,pp. : 167-177

Elsevier

Access to resources Recommend Favorite

Growth and characterization of AlxGa1−xN lateral polarity structures

PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Vol. 212, Iss. 5, 2015-05 ,pp. : 1039-1042

John Wiley & Sons Inc

Access to resources Recommend Favorite