Numerical investigation of nanoscale SiGe DG MOSFET performance against the interfacial defects

E-ISSN： 1610-1642|12|1‐2|131-135

ISSN： 1862-6351

Source： PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol.12, Iss.1‐2, 2015-01, pp. : 131-135

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