Temperature dependence on RF avalanche breakdown of RF mosfets in the impact ionization region

Publisher: John Wiley & Sons Inc

E-ISSN: 1098-2760|57|4|817-820

ISSN: 0895-2477

Source: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, Vol.57, Iss.4, 2015-04, pp. : 817-820

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Abstract