A Review of Recent In Situ Deformation Studies Using Synchrotron X-Ray (Micro) Beams

Publisher: Bentham Science Publishers

E-ISSN: 1876-4037|4|2|97-105

ISSN: 1876-4029

Source: Micro and Nanosystems, Vol.4, Iss.2, 2012-06, pp. : 97-105

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Abstract