Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p—Si and Al/Bi4Ti3O12/p—Si structures by using the admittance spectroscopy method

Author： Yıldırım Mert   Durmuş Perihan   Altındal Şemsettin  

Publisher： IOP Publishing

E-ISSN： 1741-4199|22|10|108502-108507

ISSN： 1674-1056

Source： Chinese Physics B, Vol.22, Iss.10, 2013-10, pp. : 108502-108507

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