Author: Xiang Li Degang Zhao Desheng Jiang Ping Chen Zongshun Liu Jianjun Zhu Ming Shi Danmei Zhao Wei Liu Shuming Zhang Hui Yang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.7, 2015-07, pp. : 74009-74013
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Abstract
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