Author: Xin Tan Yuanjie Lü Guodong Gu Li Wang Shaobo Dun Xubo Song Hongyu Guo Jiayun Yin Shujun Cai Zhihong Feng
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.7, 2015-07, pp. : 74008-74011
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Abstract
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