Author: Yongping Liao Yu Zhang Junliang Xing Sihang Wei Hongyue Hao Guowei Wang Yingqiang Xu Zhichuan Niu
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.5, 2015-05, pp. : 54007-54010
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