A platform for in-situ multi-probe electronic measurements and modification of nanodevices inside a transmission electron microscope

By Xu T T   Ning Z Y   Shi T W   Fu M Q   Wang J Y   Chen Q  

Nanotechnology, Vol. 25, Iss. 22, 2014-06 ,pp. : 225702-225709

IOP Publishing

Access to resources Recommend Favorite

In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope

By Zhang Chao   Xu Zhi   Tian Wei   Tang Dai-Ming   Wang Xi   Bando Yoshio   Fukata Naoki   Golberg Dmitri  

Nanotechnology, Vol. 26, Iss. 15, 2015-04 ,pp. : 154001-154008

IOP Publishing

Access to resources Recommend Favorite

Persistent enhancement of the carrier density in electron irradiated InAs nanowires

By Durand Corentin   Berthe Maxime   Makoudi Younes   Nys Jean-Philippe   Leturcq Renaud   Caroff Philippe   Grandidier Bruno  

Nanotechnology, Vol. 24, Iss. 27, 2013-07 ,pp. : 275706-275712

IOP Publishing

Access to resources Recommend Favorite

Point defect reactions in silicon studied in situ by high flux electron irradiation in high voltage transmission electron microscope

By Vanhellemont J.   Romano-Rodríguez A.   Fedina L.   Van Landuyt J.   Aseev A.  

Materials Science and Technology, Vol. 11, Iss. 11, 1995-11 ,pp. : 1194-1202

Maney Publishing

Access to resources Recommend Favorite

Full thermoelectric characterization of InAs nanowires using MEMS heater/sensors

By Karg S F   Troncale V   Drechsler U   Mensch P   Kanungo P Das   Schmid H   Schmidt V   Gignac L   Riel H   Gotsmann B  

Nanotechnology, Vol. 25, Iss. 30, 2014-08 ,pp. : 305702-305710

IOP Publishing

Access to resources Recommend Favorite