Effect of inductors to mitigate the hot-spot problem in parallel-connected superconducting thin-film fault current limiting elements

Author： Yamasaki H Furuse M Kaiho K

Publisher： IOP Publishing

E-ISSN： 1361-6668|28|6|65012-65022

ISSN： 0953-2048

Source： Superconductor Science and Technology, Vol.28, Iss.6, 2015-06, pp. : 65012-65022

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Thermal contact resistance at the Nb/Cu interface as a limiting factor for sputtered thin film RF superconducting cavities

By Palmieri V Vaglio R

Superconductor Science and Technology, Vol. 29, Iss. 1, 2016-01 ,pp. : 15004-15015

IOP Publishing

Access to resources Recommend Favorite

Electrical Stress Effect on On-Current of MILC Poly-Si Thin-Film Transistors

By Byun Chang Woo Son Se Wan Lee Yong Woo Joo Seung Ki

Journal of Nanoscience and Nanotechnology, Vol. 13, Iss. 10, 2013-10 ,pp. : 7046-7049

American Scientific Publishers

Access to resources Recommend Favorite

LEAKAGE CURRENT CHARACTERISTICS OF Pt/Ba0.6Sr0.4TiO3/Pt THIN-FILM CAPACITORS

By Fu Chunlin Pan Fusheng Cai Wei

Integrated Ferroelectrics, Vol. 91, Iss. 1, 2007-06 ,pp. : 112-118

Taylor & Francis Ltd

Access to resources Recommend Favorite

Leakage Current Behavior of the Bottom Gate Poly Thin-Film Transistor Fabricated by Copper Damascene Process

By Yun Seung Jae Lee Yong Woo Son Se Wan Byun Chang Woo Joo Seung Ki

Journal of Nanoscience and Nanotechnology, Vol. 13, Iss. 10, 2013-10 ,pp. : 7155-7157

American Scientific Publishers

Access to resources Recommend Favorite

Far-infrared electrodynamics of thin superconducting NbN film in magnetic fields

By Šindler M Tesař R Koláček J Szabó P Samuely P Hašková V Kadlec C Kadlec F Kužel P

Superconductor Science and Technology, Vol. 27, Iss. 5, 2014-05 ,pp. : 55009-55016

IOP Publishing

Access to resources Recommend Favorite