General observation of the memory effect in metal-insulator-ITO structures due to indium diffusion

Author: WuXiaojing   XuHuihua   WangYu   RogachAndrey L   ShenYingzhong   ZhaoNi  

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|7|74002-74007

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.7, 2015-07, pp. : 74002-74007

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