Ionizing radiation effect on metal–ferroelectric–insulator–semiconductor memory capacitors

Author： YanS A LiG ZhaoW GuoH X XiongY TangM H LiZ XiaoY G ZhangW L LeiZ F ZhouY C

E-ISSN： 1361-6641|30|8|85020-85027

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.30, Iss.8, 2015-08, pp. : 85020-85027

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