Prospects of X‐ray photoemission electron microscopy at the first beamline of the Polish synchrotron facility ‘Solaris’

E-ISSN： 1097-4539|44|5|317-322

ISSN： 0049-8246

Source： X-RAY SPECTROMETRY, Vol.44, Iss.5, 2015-09, pp. : 317-322

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Energy-dispersive X-ray diffraction beamline at Indus-2 synchrotron source

By PANDEY K

Pramana, Vol. 80, Iss. 4, 2013-04 ,pp. : 607-619

Springer Publishing Company

Access to resources Recommend Favorite

Low-energy electron diffraction, Scanning tunneling microscopy and X-ray photoemission spectroscopy investigations of DMe-DCNQI on Cu(110)

By Kopf H. Seidel C. Fuchs H.

Thin Solid Films, Vol. 342, Iss. 1, 1999-03 ,pp. : 307-311

Elsevier

Access to resources Recommend Favorite

X-ray photoemission and Auger electron spectroscopy analysis of fast responding activated metal oxide silicon carbide gas sensors

By Lloyd Spetz A. Schmeiszer D. Baranzahi A. Walivaara B. Gopel W. Lundstrom I.

Thin Solid Films, Vol. 299, Iss. 1, 1997-05 ,pp. : 183-189

Elsevier

Access to resources Recommend Favorite

X-ray diffraction and electron microscopy investigation of porous Si 1-x Ge x

By Buttard D. Schoisswohl M. Cantin J.L. von Bardeleben H.J.

Thin Solid Films, Vol. 297, Iss. 1, 1997-04 ,pp. : 233-236

Elsevier

Access to resources Recommend Favorite

Time-resolved two photon photoemission electron microscopy

By Schmidt O. Bauer M. Wiemann C. Porath R. Scharte M. Andreyev O. Schönhense G. Aeschlimann M.

Applied Physics B, Vol. 74, Iss. 3, 2002-03 ,pp. : 223-227

Springer Publishing Company

Access to resources Recommend Favorite