High‐resolution X‐ray diffractometric, topographic and reflectometric studies of epitaxial layers on porous silicon destined for exfoliation

Publisher： John Wiley & Sons Inc

E-ISSN： 1097-4539|44|5|363-370

ISSN： 0049-8246

Source： X-RAY SPECTROMETRY, Vol.44, Iss.5, 2015-09, pp. : 363-370

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