A new approach to express ToF SIMS depth profiling

Publisher: John Wiley & Sons Inc

E-ISSN: 1096-9918|47|7|771-776

ISSN: 0142-2421

Source: SURFACE AND INTERFACE ANALYSIS, Vol.47, Iss.7, 2015-07, pp. : 771-776

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract