In‐situ measurement of thickness‐dependent Pendellösung oscillations from a precipitation process in silicon at 650 °C

E-ISSN： 1610-1642|9|10‐11|1920-1923

ISSN： 1862-6351

Source： PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol.9, Iss.10‐11, 2012-10, pp. : 1920-1923

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