McSAS: software for the retrieval of model parameter distributions from scattering patterns

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|3|962-969

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.3, 2015-06, pp. : 962-969

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Abstract