The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor for in situ X‐ray scattering investigations of growing nanoparticles and semiconductor nanowires

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|3|688-700

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.3, 2015-05, pp. : 688-700

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Custom AFM for X‐ray beamlines: in situ biological investigations under physiological conditions

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 6, 2015-11 ,pp. : 1364-1371

John Wiley & Sons Inc

Access to resources Recommend Favorite

An in situ atomic force microscope for normal‐incidence nanofocus X‐ray experiments

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1110-1117

John Wiley & Sons Inc

Access to resources Recommend Favorite

Calibration of a compact XUV soft X‐ray monochromator with a digital autocollimator in situ

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1232-1236

John Wiley & Sons Inc

Access to resources Recommend Favorite

HERMES: a soft X‐ray beamline dedicated to X‐ray microscopy

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 968-979

John Wiley & Sons Inc

Access to resources Recommend Favorite

Single‐crystal X‐ray diffraction and resonant X‐ray magnetic scattering at helium‐3 temperatures in high magnetic fields at beamline P09 at PETRA III

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 5, 2015-09 ,pp. : 1207-1214

John Wiley & Sons Inc

Access to resources Recommend Favorite