Author: Xinhai Yu Changchun Chai Xingrong Ren Yintang Yang Xiaowen Xi Yang Liu
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.8, 2014-08, pp. : 84011-84016
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.